Nanopositioning for Microscopy
Fast – Compact – To the Nanometer
Precision positioning is the key element in all types of microscopy. High-resolution microscopy must be capable of accurate and reproducible positioning of imaging elements and samples. Requirements range from Z focus positioning of the objective to coarse and fine positioning of the sample in X, Y, and Z direction as well as often in θX and θY direction and sometimes even in θZ. PI meets these requirements with a broad product portfolio for inverse microscope systems of all major manufacturers.
Coarse and Fine Positioning Sample Stages
- U-780 PILine® XY Stage System with Controller and Joystick
- High-resolution piezo linear drive
- Self-locking at rest | Low noise
- Highest stability due to low thermal load and no lubricants
- Large dynamics range of 10 µm/s to 120 mm/s
- Travel range to 135 mm x 85 mm
- Compatible with a wide range of sample holders
- Large selection of fine positioning stages for positioning of samples (sample holders) in the nanometer range
- Positioning with (sub)nanometer precision in one (Z) direction or in many DOFs; depending on the model and requirements
- Wide variety of travel ranges and speed
PIFOC® Objective Scanners: Focusing and Z-Stack Scanning with Nanometer Precision
- With a wide range of PIFOC® lens scanners, PI provides the ability to do just the experiment / sample analysis you want to perform.
- Latest developments comprise the newly designed PIFOC® P-725.1CDE2 with improved settling times.
Downloads
White Paper
PI Ultra-High Resolution Microscopy
Ultra-High-Resolution Microscopy in a Modular System
Version / Date
WP pi1114
pdf - 971 KB
Version / Date
WP pi1114
pdf - 969 KB
Brochure
Nanopositioning for Microscopy
Fast, Compact, to the Nanometer
Version / Date
BRO28E R5D
pdf - 8 MB
Version / Date
BRO28CN 2018-12
pdf - 15 MB
